Analysis of functional materials by X-ray photoelectron spectroscopy

Karen Wilson, Adam F Lee

Research output: Chapter in Book/Published conference outputChapter (peer-reviewed)peer-review


X-ray photoelectron spectroscopy (XPS) can play an important role in guiding the design of new materials, tailored to meet increasingly stringent constraints on performance devices, by providing insight into their surface compositions and the fundamental interactions between the surfaces and the environment. This chapter outlines the principles and application of XPS as a versatile, chemically specific analytical tool in determining the electronic structures and (usually surface) compositions of constituent elements within diverse functional materials. Advances in detector electronics have opened the way for development of photoelectron microscopes and instruments with XPS imaging capabilities. Advances in surface science instrumentation to enable time-resolved spectroscopic measurements offer exciting opportunities to quantitatively investigate the composition, structure and dynamics of working catalyst surfaces. Attempts to study the effects of material processing in realistic environments currently involves the use of high- or ambient-pressure XPS in which samples can be exposed to reactive environments.
Original languageEnglish
Title of host publicationLocal structural characterisation
EditorsDuncan W. Bruce, Dermot O'Hare, Richard I. Walton
Place of PublicationChichester (UK)
Number of pages50
ISBN (Electronic)978-1-118-68190-9
ISBN (Print)978-1-119-95320-3
Publication statusPublished - 9 Sept 2013

Publication series

NameInorganic materials series
PublisherJohn Wiley & Sons


  • ambient-pressure XPS
  • electronic structures
  • functional materials
  • high-pressure XPS
  • photoelectron microscopes
  • X-ray photoelectron spectroscopy
  • XPSimaging


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