Abstract
This paper reports on processing methods used to produce phase masks for near field holographic writing of fibre gratings. The masks are produced using e-beam lithography (EBL) and reactive ion etching (RIE). We shall discuss the relations between grating parameters such as ridge duty cycle and groove-depth and processing conditions such as exposure dose and resist profiles.
Original language | English |
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Pages (from-to) | 345-348 |
Number of pages | 4 |
Journal | Microelectronic Engineering |
Volume | 35 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - Feb 1997 |
Event | International conference on micro- and nano-engineering 96 - Glasgow, United Kingdom Duration: 22 Sept 1996 → 25 Sept 1996 |
Keywords
- processing methods
- phase masks
- near field holographic writing
- fibre gratings
- e-beam lithograph
- EBL
- reactive ion etching
- RIE
- ridge duty cycle
- groove-depth
- exposure dose
- resist profiles