Fast identification of rubrene polymorphs by lattice phonon Raman microscopy

Joseph Socci, Tommaso Salzillo*, Raffaele Guido della Valle, Elisabetta Venuti, Aldo Brillante

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Confocal Raman microscopy in the lattice phonon region has been used to study the polymorphism of the organic semiconductor 5,6,11,12-tetraphenyl-tetracene (rubrene). Following literature guidelines, crystals of rubrene have been prepared using a number of solution growth and vapour deposition methods, obtaining samples of different morphologies which could be related to the various polymorphs of this compound. The technique has enabled us an easy and non invasive identification of the three known polymorphs and of their phase homogeneity with a lateral spatial resolution below 1 μm.

Original languageEnglish
Pages (from-to)146-151
Number of pages6
JournalSolid State Sciences
Early online date22 Jul 2017
Publication statusPublished - Sept 2017


  • lattice phonons
  • organic semiconductors
  • polymorphism
  • Raman microscopy
  • rubrene


Dive into the research topics of 'Fast identification of rubrene polymorphs by lattice phonon Raman microscopy'. Together they form a unique fingerprint.

Cite this