Abstract
We demonstrate a Fourier Transform Spectroscopic approach to achieve high-resolution measurement of the structural detail of the reflected spectra from an infrared FBG grating array, with the inherent measurement capability over a wavelength range of 900 nm. Measurements on all gratings in the array are achieved in a single scan of the OPD, from an interferogram captured on a single InGaAs photodiode. We demonstrate the approach for measurements on standard gratings and in the case of a grating subjected to a nonuniform measurand. The OPD is referenced from a visible HeNe beam propagated on the array downlead, and we demonstrate the robustness of the measurement in the presence of the complex transverse modal structure of that reference beam.
Original language | English |
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Pages (from-to) | 423 |
Journal | Proceedings of SPIE - International Society for Optical Engineering |
Volume | 5502 |
DOIs | |
Publication status | Published - 9 Jun 2004 |
Event | Second European Workshop on Optical Fibre Sensors - Santander, Spain Duration: 9 Jun 2004 → … |