Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model

Chun Hung Cheng; Dehong Huo; Xi Zhang; Wei Dai; Paul G. Maropoulos

doi:10.1007/978-3-642-10430-5_78

Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model

Chun Hung Cheng, Dehong Huo, Xi Zhang, Wei Dai, Paul G. Maropoulos

Research output: Chapter in Book/Published conference output › Conference publication

Abstract

Aircraft manufacturing industries are looking for solutions in order to increase their productivity. One of the solutions is to apply the metrology systems during the production and assembly processes. Metrology Process Model (MPM) (Maropoulos et al, 2007) has been introduced which emphasises metrology applications with assembly planning, manufacturing processes and product designing. Measurability analysis is part of the MPM and the aim of this analysis is to check the feasibility for measuring the designed large scale components. Measurability Analysis has been integrated in order to provide an efficient matching system. Metrology database is structured by developing the Metrology Classification Model. Furthermore, the feature-based selection model is also explained. By combining two classification models, a novel approach and selection processes for integrated measurability analysis system (MAS) are introduced and such integrated MAS could provide much more meaningful matching results for the operators.

Original language	English
Title of host publication	Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology
Editors	George Q. Huang, K.L. Mak, Paul G. Maropoulos
Place of Publication	Berlin (DE)
Publisher	Springer
Pages	1013-1026
Number of pages	14
ISBN (Electronic)	978-3-642-10430-5
ISBN (Print)	978-3-6421-0429-9
DOIs	https://doi.org/10.1007/978-3-642-10430-5_78
Publication status	Published - 2010
Event	6th CIRP International Conference on Digital Enterprise Technology - Hong Kong, China Duration: 14 Dec 2009 → 16 Dec 2009

Publication series

Name	Advances in Intelligent and Soft Computing
Publisher	Springer
Volume	66
ISSN (Print)	1867-5662

Conference

Conference	6th CIRP International Conference on Digital Enterprise Technology
Abbreviated title	DET 2009
Country/Territory	China
City	Hong Kong
Period	14/12/09 → 16/12/09

Keywords

assembly planning
feature-based selection model
measurability analysis
metrology classification model
process modelling

Access to Document

10.1007/978-3-642-10430-5_78

Cite this

Cheng, C. H., Huo, D., Zhang, X., Dai, W., & Maropoulos, P. G. (2010). Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model. In G. Q. Huang, K. L. Mak, & P. G. Maropoulos (Eds.), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology (pp. 1013-1026). (Advances in Intelligent and Soft Computing; Vol. 66). Springer. https://doi.org/10.1007/978-3-642-10430-5_78

Cheng, Chun Hung ; Huo, Dehong ; Zhang, Xi et al. / Large volume metrology process model : measurability analysis with integration of metrology classification model and feature-based selection model. Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. editor / George Q. Huang ; K.L. Mak ; Paul G. Maropoulos. Berlin (DE) : Springer, 2010. pp. 1013-1026 (Advances in Intelligent and Soft Computing).

@inproceedings{f34a532c45054d0b88b340396ab4726d,

title = "Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model",

abstract = "Aircraft manufacturing industries are looking for solutions in order to increase their productivity. One of the solutions is to apply the metrology systems during the production and assembly processes. Metrology Process Model (MPM) (Maropoulos et al, 2007) has been introduced which emphasises metrology applications with assembly planning, manufacturing processes and product designing. Measurability analysis is part of the MPM and the aim of this analysis is to check the feasibility for measuring the designed large scale components. Measurability Analysis has been integrated in order to provide an efficient matching system. Metrology database is structured by developing the Metrology Classification Model. Furthermore, the feature-based selection model is also explained. By combining two classification models, a novel approach and selection processes for integrated measurability analysis system (MAS) are introduced and such integrated MAS could provide much more meaningful matching results for the operators.",

keywords = "assembly planning, feature-based selection model, measurability analysis, metrology classification model, process modelling",

author = "Cheng, {Chun Hung} and Dehong Huo and Xi Zhang and Wei Dai and Maropoulos, {Paul G.}",

year = "2010",

doi = "10.1007/978-3-642-10430-5_78",

language = "English",

isbn = "978-3-6421-0429-9",

series = "Advances in Intelligent and Soft Computing",

publisher = "Springer",

pages = "1013--1026",

editor = "Huang, {George Q.} and K.L. Mak and Maropoulos, {Paul G.}",

booktitle = "Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology",

address = "Germany",

note = "6th CIRP International Conference on Digital Enterprise Technology, DET 2009 ; Conference date: 14-12-2009 Through 16-12-2009",

}

Cheng, CH, Huo, D, Zhang, X, Dai, W & Maropoulos, PG 2010, Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model. in GQ Huang, KL Mak & PG Maropoulos (eds), Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Advances in Intelligent and Soft Computing, vol. 66, Springer, Berlin (DE), pp. 1013-1026, 6th CIRP International Conference on Digital Enterprise Technology, Hong Kong, China, 14/12/09. https://doi.org/10.1007/978-3-642-10430-5_78

Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model. / Cheng, Chun Hung; Huo, Dehong; Zhang, Xi et al.
Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. ed. / George Q. Huang; K.L. Mak; Paul G. Maropoulos. Berlin (DE): Springer, 2010. p. 1013-1026 (Advances in Intelligent and Soft Computing; Vol. 66).

Research output: Chapter in Book/Published conference output › Conference publication

TY - GEN

T1 - Large volume metrology process model

T2 - 6th CIRP International Conference on Digital Enterprise Technology

AU - Cheng, Chun Hung

AU - Huo, Dehong

AU - Zhang, Xi

AU - Dai, Wei

AU - Maropoulos, Paul G.

PY - 2010

Y1 - 2010

N2 - Aircraft manufacturing industries are looking for solutions in order to increase their productivity. One of the solutions is to apply the metrology systems during the production and assembly processes. Metrology Process Model (MPM) (Maropoulos et al, 2007) has been introduced which emphasises metrology applications with assembly planning, manufacturing processes and product designing. Measurability analysis is part of the MPM and the aim of this analysis is to check the feasibility for measuring the designed large scale components. Measurability Analysis has been integrated in order to provide an efficient matching system. Metrology database is structured by developing the Metrology Classification Model. Furthermore, the feature-based selection model is also explained. By combining two classification models, a novel approach and selection processes for integrated measurability analysis system (MAS) are introduced and such integrated MAS could provide much more meaningful matching results for the operators.

AB - Aircraft manufacturing industries are looking for solutions in order to increase their productivity. One of the solutions is to apply the metrology systems during the production and assembly processes. Metrology Process Model (MPM) (Maropoulos et al, 2007) has been introduced which emphasises metrology applications with assembly planning, manufacturing processes and product designing. Measurability analysis is part of the MPM and the aim of this analysis is to check the feasibility for measuring the designed large scale components. Measurability Analysis has been integrated in order to provide an efficient matching system. Metrology database is structured by developing the Metrology Classification Model. Furthermore, the feature-based selection model is also explained. By combining two classification models, a novel approach and selection processes for integrated measurability analysis system (MAS) are introduced and such integrated MAS could provide much more meaningful matching results for the operators.

KW - assembly planning

KW - feature-based selection model

KW - measurability analysis

KW - metrology classification model

KW - process modelling

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UR - http://link.springer.com/chapter/10.1007/978-3-642-10430-5_78

U2 - 10.1007/978-3-642-10430-5_78

DO - 10.1007/978-3-642-10430-5_78

M3 - Conference publication

AN - SCOPUS:84903844397

SN - 978-3-6421-0429-9

T3 - Advances in Intelligent and Soft Computing

SP - 1013

EP - 1026

BT - Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology

A2 - Huang, George Q.

A2 - Mak, K.L.

A2 - Maropoulos, Paul G.

PB - Springer

CY - Berlin (DE)

Y2 - 14 December 2009 through 16 December 2009

ER -

Cheng CH, Huo D, Zhang X, Dai W, Maropoulos PG. Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model. In Huang GQ, Mak KL, Maropoulos PG, editors, Proceedings of the 6th CIRP-Sponsored International Conference on Digital Enterprise Technology. Berlin (DE): Springer. 2010. p. 1013-1026. (Advances in Intelligent and Soft Computing). doi: 10.1007/978-3-642-10430-5_78

Large volume metrology process model: measurability analysis with integration of metrology classification model and feature-based selection model

Abstract

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Keywords

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