Keyphrases
Electrical Properties
100%
Ferroelectric Properties
100%
Microstructural Properties
100%
Aurivillius Phase
100%
Sm3+
100%
Applied Electric Field
50%
X-ray Raman Spectroscopy
50%
X-ray Diffraction Spectroscopy
50%
Spectroscopy Studies
50%
Pt(111)
50%
Orthorhombic Structure
50%
Remnant Polarization
50%
Si-SiO2
50%
Leakage Current Density
50%
Chemical Solution Deposition Method
50%
Low Leakage Current
50%
Coercive Field
50%
TiSi
50%
Doped Thin Films
50%
Ferroelectric Hysteresis Loop
50%
Chemistry
Ferroelectricity
100%
Electrical Property
100%
Electric Field
50%
Purity
50%
X-Ray Diffraction
50%
Current Density
50%
Leakage Current
50%
Chemical Solution Deposition
50%
Raman Spectrometry
50%
Raman Spectroscopy
50%
Agricultural and Biological Sciences
X-Ray Diffraction
100%
Purity
100%
Raman Spectroscopy
100%
Material Science
Thin Films
100%
Ferroelectricity
100%
Density
11%
X-Ray Diffraction
11%
Raman Spectroscopy
11%
Ferroelectric Material
11%
Solution (Chemistry)
11%
Engineering
Thin Films
100%
Applied Electric Field
11%
Ray Diffraction
11%
Measured Value
11%
Hysteresis Loop
11%
Deposition Method
11%
Coercive Field
11%
Aurivillius Phase
11%
Silicon Dioxide
11%